Information about the level instrument used in the circuit. Node describing the level equipment used. The manufacturer name of the level. The model number of the level. The serial number of the level. The date for which the digital collimation error was observed. Usually the date of the last peg test. The current digital collimation error as found by the last instrument QA test which is usually a peg test. The date for which the optical collimation error was observed. Usually the date of the last peg test. The current optical collimation error as found by the last instrument QA test which is usually a peg test.